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Flake ScanningIon-ConductanceMicroscopy FFM BiasMode PANI Glass layers Blood LightEmission fe_nd_b Styrene Polyurethane HighResolution FrictionalForceMicroscopy PS_LDPE MoS2 Reduction MembraneFilter MfmPhase hard_disk_media TemperatureControllerStage AmplitudeModulation plastics Trench Anneal dielectric trench suspended_graphene LFM ForceVolumeMapping Self-assembledMonolayer single_layer Sic STO RedBloodCell Austenite
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Domain switching on PZT
Scanning Conditions
- System: NX10
- Scan Mode: Lithography, PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black +10V, White -10V