-
Tungsten StrontiuTitanate PVAP3HT Steps Transparent LiBattery MagneticForceMicroscopy FastScan ForceDistanceSpectroscopy Sio2 Inorganic Silicon UnivMaryland Leakage Tape Litho LiNbO3 Celebration ChemicalCompound LifeScience Mechanical&nanotechnology SicMosfet Typhimurium Blend Scanning_Thermal_Microscopy SiliconOxide Writing Modulus Filter vertical_PFM Ram Oxide self-assembly KelvinProbeForceMicroscopy AlkaneFilm
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defects of Reflex lens
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512