-
Stiffness Vortex Christmas Bismuth Non-ContactMode self-assembled_monolayer Tin sulfide SrTiO3 PetruPoni Change FrictionForce InsulatorFilm AIN Moire HiVacuum CrystalGrowing Annealed Genetic NTU FM-KPFM Copper PECurve Biology Roughness SiliconCrystal PhaseImaging high_resolution Polarization PhaseChange Writing Ananth CuFoil HanyangUniv optoelectronics Magnetic Force Microscopy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
LiNbO3 wafer
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size:20μm×20μm, 2.5μm×2.5μm
- Scan Rate: 5Hz, 10Hz
- Pixel: 512×512, 256×256
- Scan Mode: Non-contact
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size:20μm×20μm, 2.5μm×2.5μm
- Scan Rate: 5Hz, 10Hz
- Pixel: 512×512, 256×256