Edwin Collagen C_AFM light_emission SurfaceChange TungstenDeposition dielectric trench Roughness DataStorage TemperatureControllerStage Scanning_Thermal_Microscopy HighResolution INSP Defects Chloroform Non-ContactMode Optoelectronic ContactMode Polyimide Conducting high_resolution SolarCell ScanningIon-ConductanceMicroscopy pinpoint mode DentalProsthesis MESA structure Sadowski Fe_film NCM ScanningKelvinProbeMicroscopy SiWafer non_contact CHRYSALIS_INC PUR Indium_tin_oxide