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Regensburg Aluminum ForceVolume Solar LowDensityPolyethylene BiVO4 SrTiO3 PrCurve Reading ScratchMode Vinylpyridine C_AFM HardDisk Magnetic Force Microscopy PvdfBead Pinpoint Optic PyroelectricDetector MembraneFilter Imprint sputter India pinpoint mode Copolymer Electronics Insulator Pzt Alloy Phenanthrene organic_polymer BaTiO3 University_of_Regensburg DIWafer Protein Grain
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Ferroelectric 2L-hBN
Scanning Conditions
- System : FX40
- Sample bias: 0.25 V, 0.8 V
- Scan Mode: C-AFM
- Scan Rate : 8 Hz
- Scan Size : 1.5μm×1.5μm
- Pixel Size : 256×256
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)