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OpticalModulator Conductance Hole Mfm SThM MfmPhase Sadowski norganic Sio2 FailureAnalysis ConductiveAFM Array mfm_amplitude DentalProsthesis dielectric_trench OxideLayer SrO Hysteresys KAIST Worcester_Polytechnic_Institute HumanHair 2dMaterials Laser StainlessSteel Glass SKKU Co/Cr/Pt Ptfe Gallium Corrosion Semiconductor F14H20 SiliconCrystal Friction Electronics
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Polymer (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: NCHR
- Scan Size:1μm×1μm
- Scan Rate: 1Hz
- Pixel: 256 × 256
- Scan Mode: Tapping
- Cantilever: NCHR
- Scan Size:1μm×1μm
- Scan Rate: 1Hz
- Pixel: 256 × 256