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silicon_oxide Conducting ScanningIon-ConductanceMicroscopy DLaTGS PolymerPatterns Ananth BismuthFerrite Fujian SKKU Polystyrene FAFailureAnlaysis TiO2 molecular_beam temperature controller AFM Laser MechanicalProperties Deposition Sio2 ferromagnetic ito_film Ferrite SAM BiVO4 molecules Vanadate Foil PyroelectricDetector MfmAmplitude PANI BismuthVanadate TemperatureControllerAFM Solution Al2O3 Wonseok PhaseImaging
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Block copolymer ; Fast scan
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size: 0.5μm×0.5μm
- Scan Rate: 6Hz, 13Hz
- Pixel: 256×256
- Scan Mode: Tapping
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size: 0.5μm×0.5μm
- Scan Rate: 6Hz, 13Hz
- Pixel: 256×256