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Tungsten BiFeO3 ChemicalCompound TemperatureControlledAFM StrontiuTitanate Memory GranadaUniv IcelandSpar rubber ContactModeDots polymeric_arrays Fe_film Adhesion CrAu Subhajjit STM ConductiveAFM cooling LiftHeight PUR Oxidation Praseodymium Polytetrafluoroethylene Sapphire LateralForceMicroscopy Hafnium_dioxide Pinpoint Dopped Croatia Co/Cr/Pt Change thermoplastic_elastomers KelvinProbeForceMicroscopy PANI atomic_layer
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PDMS liquid crystal
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.5Hz
- Pixel: 512×512