-
LiftMode AIN 2dMaterials AtomicLayer HexagonalBN Yeditepe IVSpectroscopy LDPE OxideLayer GranadaUniv Neodymium LiquidImaging CP-AFM ForceVolumeMapping StrontiumTitanate Pinpoint PvdfBead Galfenol CompactDisk HexagonalBoronNitride Gallium heterojunctions AEAPDES frequency_modulation fluoroaalkane BaTiO3 CuSubstrate Fendb LightEmiting molecular_beam C60H122 temp CarbonNanotube Polarization Bmp
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SiC MOSFET
Scanning Conditions
- System: NX-Hivac
- Scan Mode: SSRM
- Cantilever: Full diamond (k=27 N/m)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×512
- Sample Bias: +2.5V
- Scan Mode: SSRM
- Cantilever: Full diamond (k=27 N/m)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×512
- Sample Bias: +2.5V