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BoronNitride Roughness FuelCell LightEmiting Edwin atomic_steps Scratch MultiLayerCeramicCapacitor CalciumHydroxyapatite Polyvinylidene_fluoride Resistance single_layer Vortex pinpoint mode Litho SiliconOxide contact Ferrite BiasMode NTU Polymer high_resolution ConductiveAFM kelvin probe force microscopy Hexacontane ThinFilm EvatecAG F14H20 TempControl Floppy Composition HighAcpectRatio Lateral_Force_Microscopy Mechanical&nanotechnology bias_mode
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HOPG
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=2N/m, f=130kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×512