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Materials University_of_Regensburg Pattern Metal ScanningIon-ConductanceMicroscopy CopperFoil contact India block_copolymer AtomicLayer Au111 Ananth PVAC HanyangUniv Lanthanum_aluminate semifluorinated_alkanes Deposition SiliconCrystal LogAmplifier Sic aluminum_nitride Memory Sapphire CeramicCapacitor MoS2 Hafnium_dioxide Monisha Strontium GaN cooling Topography AIN Magnetic Force Microscopy Terrace Regensburg
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Perovskite coated on glass with Palladium electrodes
Scanning Conditions
- System : FX40
- Scan Mode: Sideband KPFM
- Scan Rate : All 0.4 Hz
- Scan Size : 40μm×40μm
- Pixel Size : All 256×256
- Cantilever : NSC36 Pt C(k=0.6N/m, f=65kHz)