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cooling CHRYSALIS_INC Zhi sputter ULCA Ferroelectric flakes Nickel Boron LateralForce Polarization Pattern PiezoelectricForceMicroscopy doped MeltingPoint India SrTiO3 electrospinning Lateral_Force_Microscopy Aggregated_molecules Force-distance OpticalWaveguides Tapping optoelectronics Vortex Array NanoLithography MoS2 HOPG UnivOfMaryland Imprint Cross-section SiliconOxide ForceMapping blended polymers
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Semi-fluorinated alkanes
Scanning Conditions
- System : NX10
- Scan Mode: Sideband KPFM
- Scan Rate : 0.4 Hz
- Scan Size : 500nm×500nm
- Pixel Size : 256×256
- Cantilever : HQ: NSC14/CR-AU (k=5N/m, f=160kHz)