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Reduction HighAcpectRatio Edwin TappingMode Styrene Wafer Mfm fluoroaalkane DIWafer ScratchMode NeodymiumMagnets Bio OpticalElement TempControl PMNPT Piezo Fet Ca10(PO4)6(OH)2 LithiumNiobate Sidewall AmplitudeModulation nanobar Chemical_Vapor_Deposition TipBiasMode Lattice Graphene SiWafer BariumTitanate Bacteria ring shape MeltingPoint Hair Hexacontane Writing Yeditepe
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2L-MoS₂ (2/3)
Scanning Conditions
- System : FX40
- Sample bias: 0.5 V
- Scan Mode: C-AFM, LFM
- Scan Rate : 12 Hz
- Scan Size : 1μm×1μm
- Pixel Size : 512×512
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)