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Modulus HACrystal Sphere Reading StrontiumTitanate ReflexLens Leakage Melt ForceDistanceSpectroscopy exfoliate NanoLithography BlockCopolymer Indium_tin_oxide Hafnia ThermalDetectors Techcomp University_of_Regensburg TipBiasMode polyvinyl acetate Regensburg Mechinical Pzt MESA structure BaTiO3 Dr.JurekSadowski Cancer layers MultiferroicMaterials Plug FrequencyModulation Magnetic WWafer CeramicCapacitor MonoLayer Nanofiber
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Mo film
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.5 Hz, 0.8 Hz
- Scan Size : 5μm2, 15μm2
- Pixel Size : All 1024×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)