-
temp_control FM-KPFM semifluorinated_alkanes InsulatorFilm PiezoelectricForceMicroscopy ElectroDeposition Force-distance Barium_titanate LeakageCurrent Dr.JurekSadowski Chloroform DeoxyribonucleicAcid Heating NUS PhaseChange StrontiuTitanate vertical_PFM NusEce Silicon Nanostructure layers CalciumHydroxyapatite CrAu ItoGlass self-assembled_monolayer Blood CopperFoil BiVO4 Logo Hysteresys FFM LogAmplifier NUS_NNI_Nanocore ULCA India
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Chip
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : All 1Hz
- Scan Size : 25μm×40μm, 15μm×40μm, 8μm×4μm
- Pixel Size : 2048×256, 2048×256, 1024×256
- Cantilever : OMCL-AC160TS(k=26N/m, f=300kHz)