-
light_emission Polyethylene AM_KPFM Ferrite EFMAmplitude Nanostructure Neodymium Gallium_Arsenide ScanningTunnelingMicroscopy Layer 2dMaterials FrictionForce Leakage MagneticPhase Ni81Fe19 Nanopattern Temasek_Lab Cross-section solar_cell Resistance TemperatureControlledAFM AAO #EC Hexylthiophene AM_SKPM flakes ScanningKelvinProbeMicroscopy #Materials Multiferroic_materials PDMS Growing PolycrystallineFerroelectricBCZT Battery Chemical_Vapor_Deposition Granada
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
CMP test key
Scanning Conditions
- System : NX20
- Scan Mode: Non-contact
- Scan Rate : 1Hz for 25μm2 / 0.6HZ for 15μm2
- Scan Size : 25μm2, 15μm2
- Pixel Size : 512×256 for 25μm2 / 1025×128 for 15μm2
- Cantilever : PPP-NCHR (k=42N/m, f=330kHz)