-
Molybdenum_disulfide Sulfur NeodymiumMagnets fifber light_emitting Thermoplastic_polyurethane SThM Electrical&Electronics Anneal MLCC SrTiO3 Device Oxidation HOPG Ferrite molecules ThermalProperties OpticalWaveguides PECurve HafniumDioxide Protein Roughness CastIron Polyethylene PetruPoni Multiferroic_materials Monisha BTO MeltingPoint Conductivity PinpointPFM SFAs mfm_amplitude AIN DOE
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
GaN on Si epi film
Scanning Conditions
- System : NX20
- Scan Mode: Non-contact
- Scan Rate : All 2 Hz
- Scan Size : 5µm2, 5µm2
- Pixel Size : ALL 512×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)