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CrossSection Tin disulfide WWafer Scratch Optoelectronic BismuthVanadate Patterns Temasek_Lab SRAM cooling Inorganic_Compound ForceVolumeMapping SicMosfet Piranha Titanate AtomicLayer LogAmplifier DiffractiveOpticalElements MolecularSelfAssembly FM-KPFM fluoroalkane FailureAnalysis TCS Ceramics ThinFilm Fiber aluminum_nitride dichalcogenide cannabinoid HighResolution TemperatureControllerAFM light_emission Ca10(PO4)6(OH)2 lift_mode HexagonalBoronNitride
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Fe Thin Films
MFM images of Fe thin films (80 nm) epitaxied on GaAs(001) and then implanted with N-atoms. Images reveal weak stripe domains at magnetic remanence.
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 15μm×15μm,2μm×2μm
- Scan Rate: 0.5Hz, 1Hz
- Pixel Size: 512×512, 256×256
- Lift height: 50nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 15μm×15μm,2μm×2μm
- Scan Rate: 0.5Hz, 1Hz
- Pixel Size: 512×512, 256×256
- Lift height: 50nm