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FM-KPFM high_resolution KevlarFiber LFM Leakage silicon_oxide Titanate Indent Adhesive SPMLabs Epoxy CNT Lift Dopped YttriaStabilizedZirconia Sio2 Photovoltaics University_of_Regensburg TempControl heterojunctions Conduct TemperatureControlledAFM Al2O3 CarbonNanotube Etch Magnetic ChemicalCompound 2dMaterials CalciumHydroxide IIT-chennai HighAcpectRatio DeoxyribonucleicAcid Pzt Yeditepe_University piezoelectric force microscopy
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MoS2 Layers on SiO2
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256