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Dr.JurekSadowski DataStorage Mechanical&nanotechnology WS2 UTEM Non-ContactMode BCZT Crystal LiquidImaging PolycrystallineFerroelectricBCZT Edwin C36H74 dielectric trench #Materials Adhesion fluoroalkane CrystalGrowing ConductiveAFM SiWafer SThM Sapphire PolyimideFilm IVSpectroscopy high_resolution NCM Annealing FM-KPFM Nickel HanyangUniv Polarization Formamidinium_lead_iodide TransitionMetal multi_layer DiffractiveOpticalElements Fendb
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MoS2
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36C Cr-Au(k=0.6N/m, f=65kHz)
- Scan Size: 12μm×12μm
- Scan Rate: 0.15Hz
- Pixel:256×256
- Scan Mode: KPFM
- Cantilever: NSC36C Cr-Au(k=0.6N/m, f=65kHz)
- Scan Size: 12μm×12μm
- Scan Rate: 0.15Hz
- Pixel:256×256