-
Filter BiFeO3 SAM kelvin probe force microscopy Flake Optoelectronic Inorganic Materials SelfAssembly Dr.JurekSadowski Corrosion Melt LMF LithiumNiobate StyreneBeads MechanicalProperty light_emission Moire Display Sulfur DNA self_healing cannabinoid NusEce Tungsten_disulfide Vortex Defects HardDisk Foil SurfaceChange AM-KPFM Platinum PFM GaAs Polypropylene
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V