-
Ito Conductance medical MolecularSelfAssembly phase_change PECurve Yttria_stabilized_Zirconia Indium_tin_oxide Tungsten_disulfide AM_SKPM InorganicCompound SFAs Deposition OrganicSemiconductor Domain Electronics Chemical_Vapor_Deposition silicon_carbide MechanicalProperty MoirePattern Pzt PolyvinylideneFluoride AnodizedAluminumOxide polyvinyl acetate Litho Film Vacuum vertical_PFM NUS_NNI_Nanocore StainlessSteel Perovskite Typhimurium mechanical property HardDiskMedia Fendb
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V