-
Mfm PolyvinylAcetate Mechanical&nanotechnology DeflectionOptics Sidewall Optoelectonics HighAcpectRatio Wafer Dimethicone Workfunction semifluorinated_alkanes AtomicSteps YttriaStabilizedZirconia SicMosfet LiquidImaging Biofilm Graphite Electronics BCZT EPFL Tapping Step AnodizedAluminumOxide sputter 2d_materials exfoliate HfO2 AlkaneFilm block_copolymer Domain NCM\ CuParticle TappingMode ScanningKelvinProbeMicroscopy MonoLayer
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Triple-cation perovskite
Scanning Conditions
- System : NX10
- Sample bias: 0 V, 0.5 V
- Scan Mode: C-AFM with PCM toolkit
- Scan Rate : 0.25 Hz
- Scan Size : 5μm×5μm
- Pixel Size : 512×512
- Cantilever : ANSCM-PC (k=0.2N/m, f=12kHz)