DeflectionOptics PANI ScanningIon-ConductanceMicroscopy AtomicLayer Roughness aluminum_nitride PS_LDPE Composite CastIron PVA Defects exfoliate hetero_structure DIWafer hard_disk_media Ito Tape Optic silicon_carbide Mechinical Polydimethylsiloxane LeakageCurrent Lanthanum_aluminate C60H122 EFM SKPM InLiquid Sidewall FrictionalForceMicroscopy polyvinyl acetate Calcite NCM semifluorinated_alkane SiWafer AdhesionEnergy