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Iron Wafer oxide_layer AIN FFM Styrene PolymerBlend Alloy Hexatriacontane CopperFoil Wang semifluorinated_alkane Chemical Vapor Deposition LiquidCrystal Global_Comm Led DOE TemperatureControllerAFM Sphere Transparent FrictionalForceMicroscopy strontiu_titanate HACrystal Etch Fet Graphene Techcomp Ferroelectric epitaxy AAO SolarCell IRDetector Co/Cr/Pt ForceVolumeMapping BTO
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Bacteria
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 1Hz
- Pixel:512×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 1Hz
- Pixel:512×256