-
AAO GlassTemperature PhaseChange CHRYSALIS_INC NiFe SurfaceOxidation Thermal Singapore Molybdenum NUS_Physics hetero_structure Perovskite Regensburg Calcite PatternedSapphireSubstrat CP-AFM FastScan Array MultiLayerCeramicCapacitor Piezo INSP Cancer EPFL Mosfet self-assembly Lanthanum_aluminate HOPG Growing UnivOfMaryland PvdfFilm Temasek_Lab SmallScan BCZT temperature controller AFM BTO
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
NiFe
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm