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frequency_modulation Multiferroic_materials Temasek_Lab ThermalDetectors Switching NCM Permalloy Materials AEAPDES PetruPoni_Institute FrictionForce Inorganic_Compound FAPbI3 lift_mode HexagonalBN Terrace pinpoint mode P3HT Photovoltaics LeakageCurrent Nanostructure AM_KPFM cannabidiol Silver HighResolution TemperatureControllerStage dielectric trench SPMLabs Holes SiliconeOxide semifluorinated_alkanes PinPointMode Indium_tin_oxide Force-distance thermal_property
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AR Lens
Scanning Conditions
- System : FX40
- Scan Mode: Non-contact
- Scan Rate : 0.5 Hz for 40μm2, 1.5 Hz for 5μm2, 2μm2
- Scan Size : 40μm2, 5μm2, 2μm2
- Pixel Size : 2048×512 for 40μm2, 5μm2, 1024×256 for 2μm2
- Cantilever : OMCL-AC55TS (k=85N/m, f=1.6kHz)