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AIN ScratchMode LateralPFM dielectric trench SKKU Worcester_Polytechnic_Institute PVAC Wang Self-assembledMonolayer ferromagnetic plastic UTEM PS_LDPE HiVacuum Dopped PhaseImaging CarbonNanotube ContactMode Edwin LiBattery TemperatureControlledAFM ShenYang Pyroelectric NtuEee Mfm ContactModeDots HumanHair TCS ForceVolumeMapping TyphimuriumBiofilm cannabidiol Pinpoint non_contact Graphite LDPE
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Chip
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : All 1Hz
- Scan Size : 25μm×40μm, 15μm×40μm, 8μm×4μm
- Pixel Size : 2048×256, 2048×256, 1024×256
- Cantilever : OMCL-AC160TS(k=26N/m, f=300kHz)