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bias_mode thermal_conductivity STM Nanotechnology Optoelectonics PatternedSapphireSubstrat DomainSwitching Hexylthiophene Dental Optoelectronic KPFM CopperFoil biocompatible SurfaceOxidation frequency_modulation Polyvinylidene Hole Thermoplastic_polyurethane TyphimuriumBiofilm DNA C_AFM Treatment Metal BreastCancerCell Tin disulfide Spain IISCBangalore Hafnium_dioxide Worcester_Polytechnic_Institute F14H20 CuSubstrate TCS MagneticForce PolymerBlend Lateral_Force_Microscopy
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WLI image of wafer ID mark
Scanning Conditions
- System : NX-Hybrid WLI
- Scan Mode: WLI
- Field of view: 182μm×182μm