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Holes TemperatureControlledAFM IVSpectroscopy DLaTGS FAPbI3 Hexylthiophene Tin disulfide Phosphide Ceramic Materials OxideLayer FM_KPFM Sadowski PtfeMembrane India Chrome BiasMode Magnetic Force Microscopy PinpointPFM CuFoil membrane EFM Singapore Nanofiber vertical_PFM Plug PinpointNanomechanicalMode SoftSample Al2O3 Metal MechanicalProperty PECurve Pore SICM Polyvinylidene
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Graphene
Scanning Conditions
- System: XE7
- Scan Mode: Conductive AFM
- Cantilever: NSC36C Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256