-
FM_SKPM HighResolution LiquidImaging DNAProtein Genetic aluminum_nitride Silicon KPFM LowDensityPolyethylene Defect piezoelectric force microscopy NTU India blended polymers Electical&Electronics FrictionalForceMicroscopy thermal_conductivity Bio ElectrostaticForceMicroscopy Spincast PinpointPFM dichalcogenide FloppyDisk Galfenol lithography Forevision Chrome Mechinical Fujian Chloroform YttriaStabilizedZirconia Ni81Fe19 Chemical Vapor Deposition IISCBangalore Workfunction
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defects of Reflex lens
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512