-
Pzt Fet PpLdpe INSP Display dielectric_trench UTEM Domain F14H20 NanoLithography ScanningIon-ConductanceMicroscopy YszSubstrate BoronNitride P3HT EFM Tungsten Ferroelectric FM_KPFM molecular_beam SiliconOxide MagneticForce Biofilm Imprint GalliumPhosphide Melt HanyangUniv TCS AmplitudeModulation Carbon Fiber thermoplastic_elastomers Moire CrystalGrowing MLCC tip_bias_mode
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Cutting Graphene
Scanning Conditions
- System : FX40
- Scan Mode: Contact after lithography
- Scan Rate : 0.7 Hz
- Scan Size : 30μm×30μm
- Pixel Size : 256×256
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)
- Lithography condition : Force 500 nN, writing speed 0.1μm/s, AC bias 10 V @ 40kHz