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CrAu thermoplastic_elastomers PvdfBead Magnetostrictive MembraneFilter KAIST DiffractiveOpticalElements NCM\ FastScan NtuEee Steps CNT Gallium_Arsenide contact Gong Ram SiliconeOxide Imprint PyroelectricDetector membrane HanyangUniv DataStorage Sapphire GlassTemperature CHRYSALIS_INC mechanical property aluminum_nitride Alloy LaAlO3 BismuthFerrite LateralForce Cell Conductivity Moire MultiferroicMaterials
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Suspended silicon nitride membrance
Scanning Conditions
- System : NX20
- Scan Mode: Tapping
- Scan Rate : 0.2 Hz
- Scan Size : 75μm×75μm
- Pixel Size : 256×256
- Cantilever : TESPA-V2 (k=37N/m, f=320kHz)