-
FM_SKPM Au111 DLaTGS PECurve PVAP3HT Strontium F14H20 Ptfe PolycrystallineFerroelectricBCZT CuSubstrate Mechanical bias_mode MembraneFilter Transparent PrCurve Vanadate PtfeMembrane Tungsten Oxide GranadaUniv Grain Vinylpyridine fluoroalkane ThermalConductivity TemperatureControl InLiquid pulsed_laser_deposition VinylAlcohol WWafer Blood Beads SiWafer AIN MagneticForce Butterfly
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
WLI image of wafer ID mark
Scanning Conditions
- System : NX-Hybrid WLI
- Scan Mode: WLI
- Field of view: 182μm×182μm