-
MoirePattern ScanningSpreadingResistanceMicroscopy Celebration ChemicalCompound Plug Croatia Domain TemperatureControl LaAlO3 PetruPoni SICM 2d_materials Microchannel Optoelectonics PvdfBead Scanning_Thermal_Microscopy CBD Polyethylene ScanningKelvinProbeMicroscopy PinPointMode Polyvinylidene_fluoride Reduction Hexacontane CntFilm Tungsten small_scan BCZT Ceramics Step molecular_beam Holes ScratchMode Pipette 2dMaterials Sic
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
GaN epi wafer
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.7 Hz
- Scan Size : 5μm×5μm
- Pixel Size : 512×512
- Cantilever : PPP-NCHR (k=42N/m, f=330kHz)