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Molybdenum_disulfide Patterns Flake Workfunction Kevlar StrontiuTitanate Electronics Optoelectronic temp_control semifluorinated_alkane Pvdf SelfAssembly LateralForce Granada AM-KPFM STM PolyimideFilm atomic_layer Hole molecular_self_assembly SiliconOxide Annealing ThinFilm Optoelectonics Fe_film Protein multi_layer epitaxy MESA structure LiftHeight organic_polymer IISCBangalore mono_layer University_of_Regensburg Magnetic Force Microscopy
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Polycrystalline ferroelectric BCZT
Scanning Conditions
- System: NX12
- Scan Mode: PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.4Hz
- Pixel: 256×256
- Sample bias sweep range for Piezoresponse curve: -10V ~ +10V