-
Polyethylene CrossSection AdhesionEnergy AEAPDES Ecoli thermal_conductivity Water GranadaUniv Cobalt-dopedIronOxide AIN SetpointMode Ni-FeAlloy Microchannel Nanotechnology Display WS2 ThermalProperties Regensburg Techcomp oxide_layer phase_change Protein Leakage Solar medical IIT-chennai PANI PinpointPFM MESA structure Patterns cannabidiol Phenanthrene StrontiumTitanate GlassTemp Magnetostrictive
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Lithography on compact disk
Scanning Conditions
- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256